“…8b and c) after electrochemical and chemical charging is negative, i.e., there is a contraction of the lattice. X-ray techniques (Laue, small angle X-ray scattering (SAXS) [14], small angle neutron scattering measurements (SANS) [13,32], transmission electron microscopy (TEM) [14] and scanning electron microscopy (SEM)), all showed the formation of defects (vacancies, voids, surface bubbles (blisters), volume bubbles and micro-cracks [33]) in plasma, gas, electrochemical and chemical hydrogen charged aluminum samples. The results suggest that the lattice expansion is much less in Al than in other FCC metals and intrinsic defect formations can take place in these kinds of materials.…”