2020
DOI: 10.1016/j.actamat.2020.09.056
|View full text |Cite
|
Sign up to set email alerts
|

Deformation faulting in a metastable CoCrNiW complex concentrated alloy: A case of negative intrinsic stacking fault energy?

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
10
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 65 publications
(11 citation statements)
references
References 108 publications
1
10
0
Order By: Relevance
“…The curves, in Figure 5 a,b, show that the inclined stacking fault starts with an intense light line at the intersection of the defect with the surface (x = 0 nm). For increasing x values, the calculated contrast fades with oscillations in agreement with experimental ECC images of twin boundary ( Figure 1 ) and stacking fault (Figure 12 in [ 6 ]). Furthermore, the more the inclination angle θ is important the more the spatial periods T and T’ (indicated, respectively, by the green and the blue lines in Figure 5 a,b) become lower (T ≈ 5 nm, T’ ≈ 50 nm for θ = 45°, and T ≈ 2 nm, T’ ≈ 18 nm for θ = 70°), and the more the contrast fades quickly.…”
Section: Theoretical Modelssupporting
confidence: 85%
See 1 more Smart Citation
“…The curves, in Figure 5 a,b, show that the inclined stacking fault starts with an intense light line at the intersection of the defect with the surface (x = 0 nm). For increasing x values, the calculated contrast fades with oscillations in agreement with experimental ECC images of twin boundary ( Figure 1 ) and stacking fault (Figure 12 in [ 6 ]). Furthermore, the more the inclination angle θ is important the more the spatial periods T and T’ (indicated, respectively, by the green and the blue lines in Figure 5 a,b) become lower (T ≈ 5 nm, T’ ≈ 50 nm for θ = 45°, and T ≈ 2 nm, T’ ≈ 18 nm for θ = 70°), and the more the contrast fades quickly.…”
Section: Theoretical Modelssupporting
confidence: 85%
“…For example, the CrMnFeCoNi high entropy alloy exhibit at room temperature deformation by dislocation slip whereas at very low temperature stacking faults and twinning act in addition [ 5 ]. Recent work has shown that the stacking faults role is predominant in response to loading in CoCrNiW metastable alloy [ 6 ]. On the other hand, the presence of such defects in materials for optoelectronic devices induces local strains leading to the degradation of their performances [ 7 , 8 ].…”
Section: Introductionmentioning
confidence: 99%
“…Since our trained model(s) are capable of predicting SFEs over the entire range (from negative to positive values), possible targets include TWIP, TRIP, TWIP/TRIP deformation mechanisms. We note that even the micro-faulting mechanism due to negative intrinsic SFE recently reported by Wei and Tasan [92] can potentially be a target for our multi-objective optimization.…”
Section: Overcoming the Strength-ductility Trade-off Through Sfe Engi...mentioning
confidence: 87%
“…3(b1)] were firstly Gaussian fitted to determine the FCC peak positions and to calculate the corresponding d-spacings. The peak shifting phenomena mentioned in "Initial microstructure and diffraction profile evolution during heating" section are next quantified by the apparent lattice strain [50]:…”
Section: Defect Content Evolution During Reverse Austenitic Transform...mentioning
confidence: 99%