Degradation behavior of high power light emitting diode under high frequency switching

Chen, S. H.; Tan, Cher Ming; Tan, Geok Kheng; He, Feifei

doi:10.1016/j.microrel.2012.06.069

Cited by 4 publications

(1 citation statement)

References 7 publications

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“…This increase in temperature also vaporize the incoming moisture at the pad which then flows along the interface between the dice and the encapsulant (including lens) due to capillary tube effect where the small gap is created as a result of the differential thermal expansion between the encapsulant and the dice. Similar phenomena is indeed observed by Chen et al [22] and confirmed by finite element analysis performed by Tan et al [15].…”

Section: B Identification Of the Degradation Physicssupporting

confidence: 89%

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Tan

Singh

2014

IEEE Trans. Device Mater. Relib.

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A high temperature-humidity test is commonly employed to evaluate the humidity reliability of electronic devices. For an integrated circuit, the degradation mechanism under the high temperature-humidity test is metal corrosion, and Peck's model is used for extrapolating the test results at accelerated test conditions to the normal operating condition. Such extrapolation is possible as the underlying degradation physics is invariant from the accelerated test conditions to the normal operating condition for integrated circuits. However, this is not true for high power LEDs, as found in this paper. The degradation in the LEDs undergoes time evolution at either 95% or 85% relative humidity (RH) and 85 • C. We also found that the degradation physics are completely different among the various RH levels from 95% to 70%. The degradation process begins from bond pad contamination and Kirkendall void formation, galvanic dissolution, phosphor dissolution to encapsulant, and die attach delamination. Such time evolution degradation physics renders the inapplicability of the Peck model and presents a challenge in extrapolation of test results to the normal operating condition for lifetime prediction.

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Section: B Identification Of the Degradation Physicssupporting

confidence: 89%

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Tan

Singh

2014

IEEE Trans. Device Mater. Relib.

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Permanent degradation mechanisms of high-power packaged white LEDs

Tan

Singh

2023

Reliability and Failure Analysis of High-Power LED Packaging

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LED dynamic electro-optical responses and light-fidelity-application optimization

2014

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Commercial light-emitting diodes (LEDs) from different manufacturers were studied by means of impedance measurements in the frequency range between 75 kHz and 10 MHz. Electrical characteristics of these LEDs, such as impedance and resistance, were proven to be strongly influenced by the applied frequencies, the bias values, and the alternating-signal amplitudes. Through these measurements, a specific bias value, which later could be of great importance, was pointed out. Coupled with the optical signal-to-noise ratio measurements, this frequency-, bias-, and alternating-signal-amplitude-dependent impedance shows a close correlation between optical and electrical responses of LEDs, which turns out to be useful for visible light communication. Hence, a new and simple method of light-fidelity optimization through impedance measurements is proposed in this article.

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Degradation behavior of high power light emitting diode under high frequency switching

Cited by 4 publications

References 7 publications

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Permanent degradation mechanisms of high-power packaged white LEDs

LED dynamic electro-optical responses and light-fidelity-application optimization

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