Degradation Mechanism of Solution-Processed Organic Light-Emitting Diodes: Sputter Depth-Profile Study

Lee, Seungjun; Ha, Hyein; Lee, Ja Yeon; Shon, Hyun Kyong; Lee, Tae Geol; Suh, Min Chul; Park, Yongsup

doi:10.1016/j.apsusc.2021.150402

Cited by 13 publications

(7 citation statements)

References 32 publications

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“…Rigid as well as flexible substrates might be chosen in the future. Similar to other OLED and OPD or organic photovoltaic (OPV) technologies, devices will need an encapsulation to protect against environmental influences, in particular, chemical degradation due to oxygen and water. − In commercial applications for OLEDs, encapsulation and material selection have been solved to a point that hundreds of operation hours can be reached. Recent research focused on flexible encapsulations and multilayer laminates/barrier stacks has shown remarkable stability for 1000 bending cycles and storage under 60 °C and 90% relative humidity for 50 days with negligible OLED degradation .…”

Section: Resultsmentioning

confidence: 99%

Magnetic Field Sensor Based on a OLED/Organic Photodetector Stack

Engmann,

Bittle,

Gundlach

2023

ACS Appl. Electron. Mater.

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In this study, an all-organic magnetic field sensor based on an organic light-emitting diode (OLED) and organic photodetector (OPD) layer stack is presented. This sensor opens possibilities to create printable, flexible magnetic field sensors using commercially viable components, allowing magnetic field sensors to be simply integrated into the existing OLED technology. The sensor function is driven by the large magneto-electroluminescence (MEL) of a thermally activated delayed fluorescence (TADF)emitter-based OLED, which in reference devices have shown an MEL of about 60% for magnetic fields on the order of 10 mT. Maximum sensitivity of about 0.15 nA/mT (150 μV/mT or 15 mV/kG with amplification) is achieved at a magnetic field of 3−4 mT. While the detectivity is limited to ∼10 −3 T•Hz −1/2 , we show this can be improved upon as the magnetic field detection sensitivity of OLEDs measured by an external Si-detector is about an order of magnitude higher. Sensitivity of 2 nA/mT and detectivities better than 10 −5 T•Hz −1/2 are demonstrated, and the intrinsic detectivity limit is estimated to be on the order of 10 −9 T•Hz −1/2 .

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Section: Resultsmentioning

confidence: 99%

Magnetic Field Sensor Based on a OLED/Organic Photodetector Stack

Engmann,

Bittle,

Gundlach

2023

ACS Appl. Electron. Mater.

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“…The application of an electric field has been found to increase both the diffusion depth and length of F 4 -TCNQ to the HTL. It was found that the diffusion of a 1 nm thickness F 4 -TCNQ layer induced exciton dissociation within the EML and led to a decrease in the stability of OLEDs [ 15 , 16 ].…”

Section: Hole Injection Layer Materialsmentioning

confidence: 99%

The Optimization of Hole Injection Layer in Organic Light-Emitting Diodes

Xing,

Wu,

Sun

et al. 2024

Nanomaterials

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Organic light-emitting diodes (OLEDs) are widely recognized as the forefront technology for displays and lighting technology. Now, the global OLED market is nearly mature, driven by the rising demand for superior displays in smartphones. In recent years, numerous strategies have been introduced and demonstrated to optimize the hole injection layer to further enhance the efficiency of OLEDs. In this paper, different methods of optimizing the hole injection layer were elucidated, including using a suitable hole injection material to minimize the hole injection barrier and match the energy level with the emission layer, exploring new preparation methods to optimize the structure of hole injection layer, and so on. Meanwhile, this article can help people to understand the current research progress and the challenges still faced in relation to the hole injection layer in OLEDs, providing future research directions to enhance the properties of OLEDs.

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“…The degradation mechanism of solution-processed organic light emitting diodes was studied by Lee et al who used TOF-SIMS and XPS in a sputtering depth-profile study. 219 The system under investigation was the poly(3,4-ethylenedioxythiophene):sodium polystyrene sulfonate. The TOF-SIMS analysis employed an Ar 1500 + (2.5 keV and 0.5 nA) gas cluster ion beam for sputtering the sample and a Bi 3 + beam (25 keV and 0.12 pA) for the analysis.…”

Section: Inorganic Materialsmentioning

confidence: 99%