2022
DOI: 10.1016/j.microrel.2022.114609
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Degradation mechanisms-based reliability modeling for metallized film capacitors under temperature and voltage stresses

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Cited by 10 publications
(4 citation statements)
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“…Until now, many researchers have examined the lifetime prediction of DCLCs under various conditions such as temperature, voltage, and humidity [4,[34][35][36]. However, there are no relevant studies in the literature on the examination of DCLC lifetime prediction based on insulation resistance.…”
Section: Effect Of Insulation Resistancementioning
confidence: 99%
“…Until now, many researchers have examined the lifetime prediction of DCLCs under various conditions such as temperature, voltage, and humidity [4,[34][35][36]. However, there are no relevant studies in the literature on the examination of DCLC lifetime prediction based on insulation resistance.…”
Section: Effect Of Insulation Resistancementioning
confidence: 99%
“…Up till now, relatively few investigations have been devoted to the effect of mechanical stress on the life and insulation performance of DCLCs. Studies on MPFC lifetime and its influencing factors mainly focus on failure mechanisms, reliability evaluations, and MPFC lifetime predictions under temperature, voltage, and humidity conditions [9][10][11][12][13]. The explorations of mechanical stress performed in MPFCs were mainly concentrated on internal pressure distribution [14], the calculation of internal pressure [15], and breakdown characteristics [16,17].…”
Section: Introductionmentioning
confidence: 99%
“…In Ref. [ 22 ], a reliability modeling method based on degradation mechanism for metallized film capacitors is proposed, in which the temperature and voltage stresses are considered. Taking metallized film capacitors as a case study, the effectiveness of this method is verified.…”
Section: Introductionmentioning
confidence: 99%