2015
DOI: 10.1117/12.2076788
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Degradation mechanisms in high-power multi-mode InGaAs-AlGaAs strained quantum well lasers for high-reliability applications

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Cited by 5 publications
(6 citation statements)
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“…The initial stages of the degradation of LDs have been rationalized [8,[41][42][43] in terms of non-radiative recombination, either surface recombination at the facet or at point defects inside the QW. The last decades view a persistent improvement of the laser structures.…”
Section: Discussionmentioning
confidence: 99%
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“…The initial stages of the degradation of LDs have been rationalized [8,[41][42][43] in terms of non-radiative recombination, either surface recombination at the facet or at point defects inside the QW. The last decades view a persistent improvement of the laser structures.…”
Section: Discussionmentioning
confidence: 99%
“…However, the concentration of these defects steadily grows as a result of the laser operation, and this increase would be responsible for the initially very slow drop in optical power of the device. The need for new experimental techniques to adequately monitor this progressive degradation has been brought forth [42].…”
Section: Discussionmentioning
confidence: 99%
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“…In the initial operational stages of the device, the temperature increases as a result of local power fluctuations whereas the thermal conductivity remains basically unaltered. Over an extended period of cw operation, the characteristics of the laser slowly deteriorate due to a progressive accumulation of point defects, as well as to other effects such as thermal lensing [20] or current-crowding [21]. All of these mechanisms result in locally enhanced power absorption levels.…”
Section: Methodsmentioning
confidence: 99%
“…According to Sin and co-workers, the degradation process involves a gradually increasing concentration of point defects. As the numbers of non-radiative recombination centres grows so does the generated heat in the hot spot, until COD is set-up [33]. Attempts to detect a precursor signature for COD were undertaken, and though the tests could be stopped for a few specimens before they showed a significant drop in the optical power output, no clear signs of extended defects were observed [29].…”
Section: Real-time Analysismentioning
confidence: 99%