2000
DOI: 10.1117/12.405347
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Degradation of carrier lifetime in irradiated lasers

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Cited by 7 publications
(3 citation statements)
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“…The threshold increase and efficiency loss typically only occur with particles that can cause displacement damage, e.g., neutrons, protons, or pions. Both effects are related to a degradation of carrier lifetime [13], [14] due to introduction of defects in the active volume, as is the case in many types of irradiated semiconductor components.…”
Section: A Radiation Damage Testsmentioning
confidence: 99%
“…The threshold increase and efficiency loss typically only occur with particles that can cause displacement damage, e.g., neutrons, protons, or pions. Both effects are related to a degradation of carrier lifetime [13], [14] due to introduction of defects in the active volume, as is the case in many types of irradiated semiconductor components.…”
Section: A Radiation Damage Testsmentioning
confidence: 99%
“…Even though this process would tend to produce a positive photocurrent in the laser cavity, the effect of a simultaneous radiation-induced reduction of the resistivity of the confinement regions is larger and leads to a net decrease in current density, due to carrier leakage from the active volume. 29,30 The higher the dose rate, the larger the resistivity decrease in the confinement areas. 31 At a critical ionizing irradiation (from electron beams rather than gamma rays) dose rate of about 10 11 to 10 12 rad(Si)·s -1 , the net current density of a laser diode decreases to J th , and lasing is temporarily interrupted.…”
mentioning
confidence: 99%
“…In fact, the first such study, 33 which appeared in 1965, was performed at Sandia. There have been several recent reports 30,31,34,35 on the application of this technique to the testing of laser diodes emitting at 1300 nm.…”
mentioning
confidence: 99%