2018
DOI: 10.9734/psij/2018/42864
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Degradation of Crystalline Silicon Photovoltaic Cells/Modules under Heat and Temperature Effect

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Cited by 6 publications
(5 citation statements)
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“…A consequence of this second type is a loss of adhesion at glass-EVA interface (GEI) and EVA-backsheet interface (EBI). These two types of bubbles have been reported and investigated in a broad range of studies [38][39][40][41].…”
Section: Voids Formationmentioning
confidence: 99%
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“…A consequence of this second type is a loss of adhesion at glass-EVA interface (GEI) and EVA-backsheet interface (EBI). These two types of bubbles have been reported and investigated in a broad range of studies [38][39][40][41].…”
Section: Voids Formationmentioning
confidence: 99%
“…A consequence of this second type is a loss of adhesion at glass-EVA interface (GEI) and EVA-backsheet interface (EBI). These two types of bubbles have been reported and investigated in a broad range of studies [38][39][40][41]. Reducing the curing temperature to 155 °C result in type I voids free samples with only few small bubbles trapped within the EVA.…”
Section: Voids Formationmentioning
confidence: 99%
“…However, also polymeric materials only degrade slowly in those conditions. This emphasizes the need to apply UV light and other stress factors at the same time in accelerated aging and degradation testing [31].…”
Section: Field Failuresmentioning
confidence: 99%
“…Failure modes in the field which occurred during operation are analyzed [31]: microcracks, cracking of back sheet, corrosion of connections, hot spots, cell breakage, delamination of encapsulant and back sheet, oxidation of busbars, yellowing/browning of encapsulants and back sheets with and without power loss, bubble formation and discoloration of busbars.…”
Section: Failure Analysismentioning
confidence: 99%
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