Degradation of gain in bipolar transistors

Kizilyalli, I.C.; Bude, J.

doi:10.1109/16.293334

IEEE Trans. Electron Devices

1994

DOI: 10.1109/16.293334

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Degradation of gain in bipolar transistors

I.C. Kizilyalli

J. Bude

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Cited by 13 publications

References 28 publications

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Degradation of gain in bipolar transistors

Cited by 13 publications

References 28 publications

Process characterisation of hot-carrier-induced β degradation in bipolar transistors for BiCMOS

Process characterisation of hot-carrier-induced β degradation in bipolar transistors for BiCMOS

Improved circuit technique to reduce h/sub fe/ degradation in bipolar output drivers

Degradation of bipolar transistor current gain by hot holes during reverse emitter-base bias stress

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