2016
DOI: 10.1021/acs.jpcc.5b12424
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Dehydrohalogenation Condensation Reaction of Phenylhydrazine with Cl-Terminated Si(111) Surfaces

Abstract: Formation of stable organic–inorganic contacts with silicon often requires oxygen- and carbon-free interfaces. Some of the general approaches to create such interfaces rely on the formation of a Si–N bond. A reaction of dehydrohalogenation condensation of Cl-terminated Si(111) surface with phenylhydrazine is investigated as a means to introduce a simple function to the surface using a –NH-NH2 moiety as opposed to previously investigated approaches. The use of substituted hydrazine allows for the formation of a… Show more

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Cited by 12 publications
(7 citation statements)
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“…This shift to a lower binding energy is due to the lower electronegativity of nitrogen compared to oxygen, and it can be clearly differentiated on the silicon surface. 22,24,53 It should be noted that on H−Si(100) reacted with hydrazine (Figure 1b), the intensity of the peak that corresponds to partial oxidation at 103.7 eV is much smaller than that on H− Si(100) before the reaction with hydrazine (Figure 1a). This may be the result of shorter exposure time for transferring the H−Si(100) sample for the hydrazine reaction compared to that required to transfer it to the XPS chamber or may indicate oxide removal during hydrazine modification.…”
Section: Resultsmentioning
confidence: 98%
“…This shift to a lower binding energy is due to the lower electronegativity of nitrogen compared to oxygen, and it can be clearly differentiated on the silicon surface. 22,24,53 It should be noted that on H−Si(100) reacted with hydrazine (Figure 1b), the intensity of the peak that corresponds to partial oxidation at 103.7 eV is much smaller than that on H− Si(100) before the reaction with hydrazine (Figure 1a). This may be the result of shorter exposure time for transferring the H−Si(100) sample for the hydrazine reaction compared to that required to transfer it to the XPS chamber or may indicate oxide removal during hydrazine modification.…”
Section: Resultsmentioning
confidence: 98%
“…The calibration of ToF-SIMS data was performed using ION-TOF measurement explorer software (version 6.3). The calibration masses were H + , H 2 + , H 3 + , C + , CH + , CH 2 + , CH 3 + , C 2 H 3 + , C 3 H 5 + , C 4 H 7 + , C 5 H 5 + , C 6 H 5 + , and C 7 H 7 + in positive mode and H – , H 2 – , C – , CH – , CH 2 – , CH 3 – , C 2 – , C 2 H – , C 3 – , C 4 – , C 5 – , C 6 – , C 7 – , C 8 – , and C 60 – in negative mode. , …”
Section: Methodsmentioning
confidence: 99%
“…18 At the same time, the previously attempted approach to produce a chemical functionality on a silicon surface by directly reacting functionalized hydrazine with Cl-terminated silicon resulted in a very low coverage and facile oxidation of the interface. 30 Thus, two-step functionalization, where the first step is silicon modification with hydrazine and the second step is the attachment to this prepared platform, should provide a more reliable path for producing the desired interface. The chemical nature and surface topography of the resulting C 60 -modified Si(111) surfaces are investigated by X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and atomic-force microscopy (AFM).…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Determining the adsorption structures of organic molecules on the technologically important Si(001) surface is an important fundamental step toward this goal. [5][6][7][8][9][10][11][12][13][14] Recent advances in atomic-scale imaging, photoelectron and X-ray absorption spectroscopy, and theoretical calculations now provide us with the ability to determine the structure of surface adsorbates with atomic-scale precision. Scanning tunnelling microscopy (STM) can provide atomically-resolved images of individual adsorbates, often resolving key features that are critical to the correct identification of the structures.…”
Section: Introductionmentioning
confidence: 99%