Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs

Pfeifer, Petr; Pliva, Zdenek

doi:10.1109/bec.2012.6376820

Cited by 7 publications

(3 citation statements)

References 4 publications

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“…In addition, they can use only interconnect resources or minimal spare logic resources. In the most of cases, all the described solutions and proposed run-time XOR-less delay-fault and aging detectors [10] do not affect the original design the FPGA designs updated of the aging and the new reliability measurement units. …”

Section: Fpgas and Brams In Detailmentioning

confidence: 98%

On utilization of BRAM in FPGA for advanced measurements in mechatronics

Pfeifer

Pliva

2015

2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM)

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Amazingly growing portfolio of new technologies gains from design and manufacturing of advanced integrated circuits. FPGAs (Field Programmable Gate Arrays) are regular parts of modern complex mechatronics systems, as a modern multidisciplinary field of engineering. They are also used in various advanced control systems, typically designed as dependable systems in order to ensure high level of reliability requirements put in many related areas. This paper presents a new previously unpublished overview and set of methods. It deals with new and unusual ways of utilization of BRAM blocks in FPGAs. They can be utilized in selected modern systems very effectively. The proposed methods and approach is demonstrated on Xilinx FPGAs. Results from experiments are included as well.

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Section: Fpgas and Brams In Detailmentioning

confidence: 98%

On utilization of BRAM in FPGA for advanced measurements in mechatronics

Pfeifer

Pliva

2015

2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM)

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“…Pfeifer et al [59] presented an online delay-fault detection technique for combinatorial circuits. The authors used the D FFs at the input of on-chip BRAMs as SRs, which map the signals to memory rows to be analysed at a later time.…”

Section: B Shadow Registermentioning

confidence: 99%

A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

Leandro¹,

Martino²,

Fey³

et al. 2023

Preprint

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Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.

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“…This paper is focused on the low-cost 28 nm devices and their behaviour under extreme temperature conditions. It will be also an important contribution to the extension of the ideas introduced in [12], with direct application into the solutions mentioned in [11].…”

Section: Introductionmentioning

confidence: 98%

On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA)

Pfeifer

Pliva

2013

2013 23rd International Conference on Field Programmable Logic and Applications

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This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq devicethe programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies.

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Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs

Cited by 7 publications

References 4 publications

On utilization of BRAM in FPGA for advanced measurements in mechatronics

On utilization of BRAM in FPGA for advanced measurements in mechatronics

A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA)

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