2024
DOI: 10.1117/1.jatis.10.1.016004
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Demonstrating repetitive non-destructive readout with SiSeRO devices

Tanmoy Chattopadhyay,
Sven Herrmann,
Peter Orel
et al.

Abstract: We demonstrate so-called repetitive non-destructive readout (RNDR) for the first time on a single electron sensitive readout (SiSeRO) device. SiSeRO is a novel on-chip charge detector output stage for charge-coupled device image sensors, developed at MIT Lincoln Laboratory. This technology uses a p-MOSFET transistor with a depleted internal gate beneath the transistor channel. The transistor sourcedrain current is modulated by the transfer of charge into the internal gate. RNDR was realized by transferring the… Show more

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Cited by 4 publications
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