2021
DOI: 10.1016/j.mseb.2021.115224
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Demonstration of vertically-ordered h-BN/AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors on Si substrate

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Cited by 17 publications
(5 citation statements)
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“…This showed that h-BN has a broad prospect in the preparation of high-performance diodes. Matthew Whiteside et al [66] prepared vertically-ordered (VO) h-BN/AlGaN/GaN metal-insulator-semiconductor high-electron-mo- In recent years, 2D transition-metal dichalcogenides (TMDs) with high transparency and thin atomic layer structures [58,59] have been widely used in nanoelectronics and optoelectronics [60][61][62]. Among typical diodes, semiconductor-insulator-semiconductor (SIS) diodes have considerable advantages over traditional p-n junction diodes.…”
Section: H-bn/iii-v Ledmentioning
confidence: 99%
See 1 more Smart Citation
“…This showed that h-BN has a broad prospect in the preparation of high-performance diodes. Matthew Whiteside et al [66] prepared vertically-ordered (VO) h-BN/AlGaN/GaN metal-insulator-semiconductor high-electron-mo- In recent years, 2D transition-metal dichalcogenides (TMDs) with high transparency and thin atomic layer structures [58,59] have been widely used in nanoelectronics and optoelectronics [60][61][62]. Among typical diodes, semiconductor-insulator-semiconductor (SIS) diodes have considerable advantages over traditional p-n junction diodes.…”
Section: H-bn/iii-v Ledmentioning
confidence: 99%
“…This showed that h-BN has a broad prospect in the preparation of high-performance diodes. Matthew Whiteside et al [66] prepared vertically-ordered (VO) h-BN/AlGaN/GaN metal-insulator-semiconductor high-electronmobility transistors on a Si substrate. In comparison to a conventional Schottky diode, the VO h-BN diode exhibited about two orders of magnitude lower gate leakage current at −20 V and two orders of magnitude lower forward current at +2 V (Figure 10f).…”
Section: H-bn/iii-v Ledmentioning
confidence: 99%
“…Some researchers tried to prepare h-BN thin films on AlGaN/GaN HEMTs directly using microwave plasma enhanced chemical vapor deposition (MWPECVD), and found that the caxis of h-BN is preferentially oriented perpendicular to the surface of the sample [9]. To take advantage of the superior in-plane properties of h-BN, such as high heat dissipation and electron mobility, vertically ordered (VO) h-BN prepared with high-power impulse magnetron sputtering deposited on GaN-based HEMTs was studied by one research group [14]. However, these equipment systems are complex and expensive.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the problem of high gate current leakage at scaled dimensions and a consequent drain current collapse, reduces its performance. As a solution to these issues, the metal-insulatorsemiconductor high electron mobility transistor (MISHEMT) is presented as an alternative [9][10][11]. With the gate insulator, the gate leakage reduces drastically and mitigates the current collapse [10,12,13].…”
Section: Introductionmentioning
confidence: 99%
“…With the gate insulator, the gate leakage reduces drastically and mitigates the current collapse [10,12,13]. The MISHEMT is a promising alternative for applications at high frequency, including 5G applications [14][15][16], power electronics [11,17], showing high power gain at 10 GHz [18], with the possibility of achieving higher RF performance of the device by adjusting the Al concentration in the AlGaN barrier [19].…”
Section: Introductionmentioning
confidence: 99%