2021
DOI: 10.1109/tpel.2020.3036442
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Demonstration of β-Ga2O3 Junction Barrier Schottky Diodes With a Baliga's Figure of Merit of 0.85 GW/cm2 or a 5A/700 V Handling Capabilities

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Cited by 123 publications
(56 citation statements)
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“…High resolution (HR) micrographs of the membranes treated at three temperatures (Figure 5c,f,h) show a well textured surface; however, with an increase in temperature a partial evaporation and material consumption necessary for recrystallization occurs. After 500 • C treatment (Figure 5d,e), ED indicates the formation of an α-Ga 2 O 3 R-3c structure oriented along the [1] axis. Additional reflections can be attributed to [1] wurtzite GaN and [111] γ-Ga 2 O 3 Fd-3m, which coincide in the given zone axis orientations for first and third order of reflections.…”
Section: Resultsmentioning
confidence: 99%
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“…High resolution (HR) micrographs of the membranes treated at three temperatures (Figure 5c,f,h) show a well textured surface; however, with an increase in temperature a partial evaporation and material consumption necessary for recrystallization occurs. After 500 • C treatment (Figure 5d,e), ED indicates the formation of an α-Ga 2 O 3 R-3c structure oriented along the [1] axis. Additional reflections can be attributed to [1] wurtzite GaN and [111] γ-Ga 2 O 3 Fd-3m, which coincide in the given zone axis orientations for first and third order of reflections.…”
Section: Resultsmentioning
confidence: 99%
“…After 500 • C treatment (Figure 5d,e), ED indicates the formation of an α-Ga 2 O 3 R-3c structure oriented along the [1] axis. Additional reflections can be attributed to [1] wurtzite GaN and [111] γ-Ga 2 O 3 Fd-3m, which coincide in the given zone axis orientations for first and third order of reflections. As XPS results demonstrate the presence of both nitrogen and oxygen species, one can conclude the formation of oxide occurs simultaneously with retention of GaN.…”
Section: Resultsmentioning
confidence: 99%
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“…The forward current transport mechanism in such junctions is typically recombination at low biases and trap-assisted tunneling at higher bias. 10,21–26 Promising rectifier performance has been reported with this approach, 14–36 including V B of 8.32 kV, with figure of merit 13.2 GW cm −2 . 15…”
Section: Introductionmentioning
confidence: 98%
“…Devices with power densities reaching as high as 1 GW/cm 2 14 and breakdown voltages up to 8 kV 8 were already realized. In addition to unipolar devices, rapid progress has been made in studying β-(AlxGa1-x)2O3/β-Ga2O3 heterostructures [15][16][17][18] and integration of p-type materials with β-Ga2O3 19 .…”
Section: Introductionmentioning
confidence: 99%