2010
DOI: 10.1021/jp108292j
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Density Distribution in the Liquid Hg−Sapphire Interface

Abstract: We present the results of a computer simulation study of the liquid density distribution normal to the interface between liquid Hg and the reconstructed (0001)

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Cited by 5 publications
(2 citation statements)
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“…Although studied for quite some time, a lack of detailed atomic-scale descriptions of these interfaces hampers the level of understanding needed to predict and control such processes as crystal growth from solution, soldering, and friction. Metal-semiconductor interfaces have proven particularly useful model systems for experimental [1,2] and theoretical [3] studies of solid-liquid interfaces. Compared with, for example, water, monatomic metals with a low melting temperature have a more simple theoretical description and, in general, are easier to interpret experimentally.…”
mentioning
confidence: 99%
“…Although studied for quite some time, a lack of detailed atomic-scale descriptions of these interfaces hampers the level of understanding needed to predict and control such processes as crystal growth from solution, soldering, and friction. Metal-semiconductor interfaces have proven particularly useful model systems for experimental [1,2] and theoretical [3] studies of solid-liquid interfaces. Compared with, for example, water, monatomic metals with a low melting temperature have a more simple theoretical description and, in general, are easier to interpret experimentally.…”
mentioning
confidence: 99%
“…Optical techniques cannot be used, owing to the optical opacity of molten metal. Transmission electron microscopy (TEM) has been most widely used, some of which achieved in situ atomic-scale analysis of dynamic processes occurring at the interfaces. These interfaces have also been investigated by X-ray reflectivity (XRR) and computational simulation. However, in general, TEM detects the averaged information in the electron beam direction, and XRR lacks the in-plane resolution. Thus, the development of an alternative experimental method to analyze these interfaces with a high spatial resolution is demanded.…”
Section: Introductionmentioning
confidence: 99%