“…A number of advanced instruments are capable of quantifying adhesion, namely, surface force apparatus (SFA), force feedback microscope, force traction device, and atomic force microscope. , AFM is by far the most prevailing technique to investigate nano- to pico-Newton range forces with nanometer actuation displacement and is apt to measure the “pull-off” force or the critical tensile load to detach two adhered bodies such as a particle on a substrate. Equipped with an environmental chamber, adhesion in moist air can be accurately measured in systems such as microparticles on an oxide surface, atomic force microscope tip interaction with a smooth or patterned surface, pollen on hydrophilic surfaces, and micro-/nanoparticle interactions. , Despite the wide applications, AFM is limited to probes with nanoscale dimensions. Governed by similar working principles, SFA measures the intersurface interaction force between the two approaching atomically smooth cylindrical surfaces by detecting the deflection of a cantilevered spring attached to one of the cylinders.…”