2020
DOI: 10.1007/s13762-020-02829-3
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Dependence of new environmental nano organic semiconductor nickel-(II)-tetraphenyl-21H,23H-porphyrin films on substrate type for energy storage applications

Abstract: Characterization of organic nickel-(II)-tetraphenyl-21H,23H-porphyrin films as a function of substrate type was performed for energy storage applications and consequently environmental enhancement. Nickel-(II)-tetraphenyl-21H,23H-porphyrin films show an amorphous phase. They have a crystallite size of 8-11 nm. Strain caused a shift of different humps' positions. The measured transmittance has high values within the range of 85-91%, and the absorption coefficient values were included within the high-absorption … Show more

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Cited by 6 publications
(5 citation statements)
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“…Consequently, it can be noted that the grown films are composed of a nanostructured crystallite distributed in an orderly manner for a short range in the presence of the dominance of the amorphous nature. These observations about the randomness of the crystal structure of the thermally grown metalloporphyrins thin films were previously reported in much research [21][22][23][24].…”
Section: Xrd Crystal Structure Analysissupporting
confidence: 76%
“…Consequently, it can be noted that the grown films are composed of a nanostructured crystallite distributed in an orderly manner for a short range in the presence of the dominance of the amorphous nature. These observations about the randomness of the crystal structure of the thermally grown metalloporphyrins thin films were previously reported in much research [21][22][23][24].…”
Section: Xrd Crystal Structure Analysissupporting
confidence: 76%
“…The absorption process occurs through this region, and direct or indirect electronic transitions may be available (Tauc 1976;El-Denglawey 2018;Mott and Davis 1971;Pankove 1971). No significant changes can be observed within the transparent or nonabsorbing region at λ > 750 nm (El-Denglawey et al 2020;Wemple and DiDomenico 1969;Mott and Davis 1971;Pankove 1971).…”
Section: T and R Characterizationmentioning
confidence: 99%
“…1b. No sharp peaks can be identified, and only a hump within 2θ (13.8-37.4°) is observed, which characterizes the amorphous phase (Warren 1953;Williamson and Hall 1953;El-Denglawey et al 2020;El-Nahass et al 2016;El-Denglawey 2018;Soliman et al 2015). The structure of the NiTPP films is developed, and the crystalline structure is pronounced after 4 and 8 h of UV illumination.…”
Section: Structural Propertiesmentioning
confidence: 99%
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