2015
DOI: 10.1002/pssc.201510109
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Dependence of plasmonic enhancement of photocurrent in a‐Si:H on the position and thickness of SiNx spacer layers

Abstract: Plasmonic interfaces integrated to the front, back and both surfaces of photovoltaic thin films show different degrees of enhancement of light trapping. Enhancements in the spectral dependence of photocurrent normalized to the power of excitation light are used as an indicator of enhanced light trapping. In a previous study, we obtained enhancement in the spectral range of 600‐700 nm by integrating 100‐nm Ag nanoparticles to the back surface of a‐Si:H with a critical dependence on the SiNx spacer layer thickne… Show more

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