2019
DOI: 10.1007/s10854-019-00824-0
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Dependence of shear strength of Sn–3.8Ag–0.7Cu/Co–P solder joints on the P content of Co–P metallization

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Cited by 7 publications
(3 citation statements)
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“…This yield function is suitable for plane stress condition. Liu et al [2] use the anisotropy yield function and a quasi-flow corner theory to predict the earing, the numerical results agree well with the experimental results of the cylindrical deep drawing. Yang and Hsu [3] used the finite element method to investigate the earing of the deep drawing process.…”
Section: Introductionmentioning
confidence: 60%
“…This yield function is suitable for plane stress condition. Liu et al [2] use the anisotropy yield function and a quasi-flow corner theory to predict the earing, the numerical results agree well with the experimental results of the cylindrical deep drawing. Yang and Hsu [3] used the finite element method to investigate the earing of the deep drawing process.…”
Section: Introductionmentioning
confidence: 60%
“…[ 13 ] They also proposed the concept of a self‐driven liquid metal cooling device for thermal chip heat dissipation within a sealed cabinet [ 14 ] and a self‐driven electronic cooling system utilizing the thermosiphon effect of liquid metal at room temperature. [ 15 ] Additionally, an integrated system involving liquid metal droplets, proposed by Khoshmanesh's research group at RMIT University in Australia, employed square wave DC signals to modulate the behavior of liquid metal droplets within cooling pipes. These signals induced surface gradient tension propelling the cooling medium's flow within the pipes.…”
Section: Introductionmentioning
confidence: 99%
“…Chen et al [ 11 ] investigated the diffusion barrier properties of Sn‐Cu joints by electrodepositing Ni, Co, amorphous Ni–W, and amorphous Co–W on a Cu substrate and found that the amorphous Co–W has the best diffusion barrier properties. Liu et al [ 12 ] found that Co–W alloys have good diffusion barrier performance and explored the possibility of replacing the commonly used Ni barrier layer in electronic packaging. To increase the solder joint quality, the diffusion barrier layer design can also indirectly obtain optimized intermetallic compounds.…”
Section: Introductionmentioning
confidence: 99%