2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 2018
DOI: 10.1109/ceidp.2018.8544910
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Dependence of the Field and Charge Distribution at a Semicon/Polyethylene Interface on the Press-Molding Process Derived from Kelvin Probe Force Microscopy

Abstract: HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L'archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d'enseignement et de recherche français ou étrangers, des labor… Show more

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