2017
DOI: 10.1016/j.egypro.2017.08.119
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Dependence on Base Width and Doping Concentration of Current Degradation in Gate-controlled Lateral PNP Bipolar Transistors Exposed to Reactor Neutrons and Gamma Rays

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Cited by 4 publications
(1 citation statement)
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“…Three kinds of gate-controlled lateral PNP transistors (GCL-PNPs) with different base widths and doping concentrations are specially designed to explore base current degradation induced by reactor neutrons and gamma rays. Dependence on base width and doping concentration of the degradation is analyzed in this work and the results are beneficial to radiation-hardening design of the lateral PNP BJT [20].…”
Section: Introductionmentioning
confidence: 99%
“…Three kinds of gate-controlled lateral PNP transistors (GCL-PNPs) with different base widths and doping concentrations are specially designed to explore base current degradation induced by reactor neutrons and gamma rays. Dependence on base width and doping concentration of the degradation is analyzed in this work and the results are beneficial to radiation-hardening design of the lateral PNP BJT [20].…”
Section: Introductionmentioning
confidence: 99%