2024 IEEE 34th Australasian Universities Power Engineering Conference (AUPEC) 2024
DOI: 10.1109/aupec62273.2024.10807630
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Dependencies of Temperature Sensitive Electrical Parameters and Influence of Degradation in Silicon Carbide MOSFETs: A Review

Shuheng Chen,
Ye Zhu,
Georgios Konstantinou
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