Deposition and characterization of PbO--PbS multilayer thin films by solution growth technique

Eya, D. D. O.

doi:10.3906/fiz-1301-19

Cited by 2 publications

(1 citation statement)

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“…The rise in band gap with annealing temperature is attributed to structural modifications, reduction in defects density, increase in oxygen content, and quantum confinement in annealed PbS films [ 33 , 34 ].…”

Section: Resultsmentioning

confidence: 99%

PbS and PbO Thin Films via E-Beam Evaporation: Morphology, Structure, and Electrical Properties

et al. 2022

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Thin films of lead sulfide (PbS) are being extensively used for the fabrication of optoelectronic devices for commercial and military applications. In the present work, PbS films were fabricated onto a soda lime glass substrate by using an electron beam (e-beam) evaporation technique at a substrate temperature of 300 °C. Samples were annealed in an open atmosphere at a temperature range of 200–450 °C for 2 h. The deposited films were characterized for structural, optical, and electrical properties. Structural properties of PbS have been studied by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), energy dispersive spectroscopy (EDS), and Rutherford backscattering spectrometry (RBS). The results of XRD showed that the PbS thin film was crystalline in nature at room temperature with cubic crystal structure (galena) and preferential (111) and orientation (022). The morphology of the thin films was studied by FESEM, which also showed uniform and continuous deposition without any peel-off and patches. EDS analysis was performed to confirm the presence of lead and sulfur in as-deposited and annealed films. The thickness of the PbS film was found to be 172 nm, which is slightly greater than the intended thickness of 150 nm, determined by RBS. Ultraviolet-Visible-Near-Infrared (UV-Vis-NIR) spectroscopy revealed the maximum transmittance of ~25% for as-deposited films, with an increase of 74% in annealed films. The band gap of PbS was found in the range of 2.12–2.78 eV for as-deposited and annealed films. Hall measurement confirmed the carriers are p-type in nature. Carrier concentration, mobility of the carriers, conductivity, and sheet resistance are directly determined by Hall-effect measurement. The as-deposited sample showed a conductivity of 5.45 × 10−4 S/m, which gradually reduced to 1.21 × 10−5 S/m due to the composite nature of films (lead sulfide along with lead oxide). Furthermore, the present work also reflects the control of properties by controlling the amount of PbO present in the PbS films which are suitable for various applications (such as IR sensors).

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Section: Resultsmentioning

confidence: 99%

PbS and PbO Thin Films via E-Beam Evaporation: Morphology, Structure, and Electrical Properties

et al. 2022

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Optical Characteristic Measurement of Micro/Nanodroplet on Embedded Grating Nanostructure for Digital Microfluidic’s Electrode

Puspaduhita,

Surawijaya,

Anshori

2023

IEEE Access

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This report describes the potential design of an optical sensor system, in which the localized surface plasmon resonance (LSPR) type was used, coupled with digital microfluidic (DMF) technology. To achieve this potential design, a dielectric material was layered on top of a metal grating nanostructure so that the nanostructure was embedded in the dielectric matrix. Then, a hydrophobic layer was stacked on top of the dielectric layer for micro/nanodroplet movement. Sensitivity and figure of merit (FoM) parameters were analyzed to evaluate this potential design. In this research, various kinds of metal were investigated, and it was found that a gold grating nanostructure embedded inside the SiO2 dielectric matrix with Teflon AF2400 as hydrophobic layer gave the optimum sensitivity. However, the iron grating nanostructure embedded inside the SiO2 dielectric matrix with Teflon AF2400 as hydrophobic layer gave the optimum FoM of 1.481. Furthermore, noble metal grating nanostructures embedded inside a dielectric layer produce higher photoelectric conversion and current density values than other types of metals that are usually used, such as aluminum, cobalt, iron, copper, etc.INDEX TERMS digital microfluidic, embedded grating nanostructure, figure of merit, localized surface plasmon resonance, sensitivity.

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Deposition and characterization of PbO--PbS multilayer thin films by solution growth technique

Cited by 2 publications

References 20 publications

PbS and PbO Thin Films via E-Beam Evaporation: Morphology, Structure, and Electrical Properties

PbS and PbO Thin Films via E-Beam Evaporation: Morphology, Structure, and Electrical Properties

Optical Characteristic Measurement of Micro/Nanodroplet on Embedded Grating Nanostructure for Digital Microfluidic’s Electrode

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