1999
DOI: 10.1557/proc-602-363
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Deposition and Electrical Characterization of Dielectric/Ferromagnetic Heterostructure

Abstract: We grow Pb(Zr,Ti)0 3 (001)/Lai.,CaxMnO3 (001) hetereostructure epitaxially on Nb doped STO substrate using pulsed laser ablation. A field effect device configuration is formed with the manganite as the channel and the Nb:STO substrate as the gate. Channel resistance modulation by the gate pulsing is studied both with and without magnetic field. We not only find a remarkably large electroresistance effect of 76% at 4x I0 5 V/ cm, but also the complimentarity of this ER effect with the widely studied CMR effect.… Show more

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