Multilayers of CeO 2 /ZrO 2 thin films were deposited on Si (100) substrates using pulsed laser deposition at an optimized oxygen partial pressure of 3x10 -2 mbar and at room temperature. The CeO 2 layer thickness was 10 nm, while the ZrO 2 layer thickness was varied as 10, 20 and 30 nm. CeO 2 and ZrO 2 layers were deposited alternately to obtain 25 bilayers. High temperature x-ray diffraction (HTXRD) results showed that the multilayer films had cubic ceria and tetragonal ZrO 2. Thermal expansion coefficients were calculated for CeO 2 and t-ZrO 2 and found to increase with the decrease of ZrO 2 layer thickness. The cross sectional transmission electron microscopy (XTEM) of CeO 2 /ZrO 2 multilayer also indicated that ceria was found to be in cubic phase while zirconia contained predominantly tetragonal phase along with cubic phase in thermally annealed specimen.