2021
DOI: 10.1021/acs.langmuir.1c00238
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Deposition of Cubic Copper Nanoparticles on Silicon Laser-Induced Periodic Surface Structures via Reactive Laser Ablation in Liquid

Abstract: We report the deposition of cubic copper nanoparticles (Cu NPs) of varying size and particle density on silicon laser-induced periodic surface structures via reactive laser ablation in liquid (RLAL) using intense femtosecond laser pulses. Two syntheses were compared: (1) simultaneous deposition, wherein a silicon wafer was laser-processed in aqueous Cu(NO 3 ) 2 solution and (2) sequential deposition, wherein the silicon wafer was laser-processed in water and then exposed to aqueous Cu(NO 3 ) 2 . Only simultane… Show more

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Cited by 17 publications
(19 citation statements)
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“…A total of five metal combinations were tested: Au–Cu, Au–Fe, Au–Zn, Cu–Fe, and Cu–Zn. To maximize metal deposition, KOH was added dropwise to the working solutions in order to achieve a pH in the range of 5.2–6.8. , The working solutions were prepared 18–24 h prior to laser processing and were stored at 6 °C. For each sample, 3.0 mL of the working solution was transferred to a 10 × 10 × 40 mm quartz fluorimeter cuvette that was cleaned with aqua regia, rinsed with water, and then equilibrated to room temperature.…”
Section: Methodsmentioning
confidence: 99%
“…A total of five metal combinations were tested: Au–Cu, Au–Fe, Au–Zn, Cu–Fe, and Cu–Zn. To maximize metal deposition, KOH was added dropwise to the working solutions in order to achieve a pH in the range of 5.2–6.8. , The working solutions were prepared 18–24 h prior to laser processing and were stored at 6 °C. For each sample, 3.0 mL of the working solution was transferred to a 10 × 10 × 40 mm quartz fluorimeter cuvette that was cleaned with aqua regia, rinsed with water, and then equilibrated to room temperature.…”
Section: Methodsmentioning
confidence: 99%
“…Figure 6b [71]. Interestingly, the intensity of the Cu(II)O peak significantly decreases accompanied by an increase of Cu(I)O as a function of sputtering depth.…”
mentioning
confidence: 88%
“…In comparison, Cu(II)O is detected in the spectra of the plasma-treated electrodes independent of the processing time, as shown in Figure 6a. To further investigate the oxidation states of the plasma-modified Cu electrode, an XPS depth profiling measurement was performed with different sputter depth rates of 3, 10, and 30 nm min -1 for the samples treated at 525 V for 60 s, as demonstrated in [71] Interestingly, the intensity of the Cu(II)O peak significantly decreases accompanied by an increase of Cu(I)O as a function of sputtering depth. More importantly, Cu(II)O cannot be detected after 30 min.…”
Section: Surface Characterizationmentioning
confidence: 99%
“…of Cu(I) and Cu(0) species are very close) [64,65] . Based on the obtained spectra, we 5b [66] . Interestingly, the intensity of the Cu [67,68] .…”
Section: Surface Characterizationmentioning
confidence: 99%