2015
DOI: 10.1016/j.diamond.2014.10.010
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Deposition of silicon-doped diamond-like carbon films by plasma-enhanced chemical vapor deposition using an intermittent supply of organosilane

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Cited by 13 publications
(8 citation statements)
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“…According to [1], such behavior of G peak position and D/G peak intensity ratio indicates a significantly increased sp 3 /sp 2 carbon bond ratio. It should be mentioned that such behavior was reported in numerous studies for both hydrogen-free and hydrogenated DLC films containing silicon or SiO x [8,[33][34][35][36]. G peak position downshift to 1505 cm −1 [21], 1495 cm −1 [23], 1480 cm −1 [12] and even as low as 1460 cm −1 [17,19] was reported.…”
Section: Structurementioning
confidence: 53%
“…According to [1], such behavior of G peak position and D/G peak intensity ratio indicates a significantly increased sp 3 /sp 2 carbon bond ratio. It should be mentioned that such behavior was reported in numerous studies for both hydrogen-free and hydrogenated DLC films containing silicon or SiO x [8,[33][34][35][36]. G peak position downshift to 1505 cm −1 [21], 1495 cm −1 [23], 1480 cm −1 [12] and even as low as 1460 cm −1 [17,19] was reported.…”
Section: Structurementioning
confidence: 53%
“…Migration paths of a-C:H samples doped with B, N, I, Si, Ag, and Ti elements [21,30,[46][47][48][49][50][51] are shown in Fig. 14(a), and that of a-C:H samples irradiated with He + , N + , and Ag + ions [52][53][54] in Fig.…”
Section: Modification Of A-c:h Samplesmentioning
confidence: 99%
“…It was modied by 4-ABA and PtNPs alternately and possessed the surface properties of both. 38 XPS is an effective and non-destructive technique for investigating the chemical composition and structure of carbon materials. In this work, a wide scan range from 0 eV to 1200 eV was employed.…”
Section: Electrode Modication and Characterizationmentioning
confidence: 99%