1981
DOI: 10.1088/0022-3727/14/9/012
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Depth profile composition studies of thin film CdS:Cu2S solar cells using XPS and AES

Abstract: Surface composition and depth profile studies of chemiplated thin film CdS:Cu2S solar cells have been carried out using X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques. These studies indicate that the junction is fairly diffused in the as-prepared cell. However, heat treatment of the cell at 210 degrees C in air relatively sharpens the junction and improves the cell performance. Using the Cu(2p32/)/S(2p) ratio as well as the Cu(LVV)/(LMM) Auger intensity ratio, it can be… Show more

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Cited by 108 publications
(50 citation statements)
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“…4c). These peaks correspond very well to the literature for the compound CdS [35,36]. Also the XPS results indicate the presence of a small amount of oxide in the CdS film.…”
Section: Resultssupporting
confidence: 89%
“…4c). These peaks correspond very well to the literature for the compound CdS [35,36]. Also the XPS results indicate the presence of a small amount of oxide in the CdS film.…”
Section: Resultssupporting
confidence: 89%
“…For the CdS film, deposited on glass, the binding energy (BE) of the Cd 3d 5/2 peak, at 405.7 eV (Table 2), is close to the range of the previously reported values for CdS [13,14]. The S 2p photoelectron peak lies at 162.4 eV, also in the vicinity of the BE values characteristic of CdS [15,16].…”
Section: Resultssupporting
confidence: 86%
“…[16] The peaks at 411.93 and 405.19 eV are attributed to the Cd 3d 5/2 and Cd 3d 3/2 of Cd 2 + in CdS. [17] The peak (Figure 3 e) at 162.16 eV is assigned to the S 2p of S 2À in CdS, [17] and the presence of other oxidation states at 168.96 eV may be due to the sulfate formed on surface. [18] The morphology and microstructure of CdS-ZnWO 4 heterojunctions are studied by SEM ( Figure S1 Figure 5 shows the UV/Vis absorption spectra of the obtained CdS-ZnWO 4 heterojunction with different CdS content.…”
Section: Resultsmentioning
confidence: 99%