1993
DOI: 10.1016/0022-3115(93)90333-t
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Depth profiles of trapped deuterium in nickel bombarded with helium-3

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Cited by 10 publications
(19 citation statements)
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“…The peak is attributed to deuterium atoms on the surface [5]. The kinetic energy of deuterium particles from plasma is as low as a few eV [6]; therefore, the particles are not implanted into the bulk region, but absorbed on the surface.…”
Section: Resultsmentioning
confidence: 98%
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“…The peak is attributed to deuterium atoms on the surface [5]. The kinetic energy of deuterium particles from plasma is as low as a few eV [6]; therefore, the particles are not implanted into the bulk region, but absorbed on the surface.…”
Section: Resultsmentioning
confidence: 98%
“…One reason for this large discrepancy may be surface roughness. The depth resolution was 160 nm in the case of nickel samples [5], for which the surface was considered to be flat. The depth resolution of 400 nm in the present work indicates that the sample surface was very rough and hence the effective area of the surface was very large.…”
Section: Resultsmentioning
confidence: 99%
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“…The present study utilizes an in situ observation technique [7] for characterization of the hydrogen trap. This is a new method in which the deuterium depth profiles of a sample are measured by means of NRA under continuous deuterium charging from a plasma source.…”
Section: Introductionmentioning
confidence: 99%