Depth profiling of deuterium implanted into stainless steel at room temperature

Interdiffusion of Low Molecular Weight Deuterated Polystyrene and Poly(methyl methacrylate)

“…Diffusion profiles are obtained by nuclear reaction analysis (NRA). This is a technique which has been used for many years in the surface analysis of materials − but only recently , has it been applied to polymer studies. It is a straightforward nondestructive measurement technique enabling good depth profiling (up to 8 μm with a resolution of 400 nm using a 2 MeV beam normal to the sample surface) and resolution (down to 15 nm using a 0.7 MeV beam at a glancing angle of 15°).…”

Profile measurements of helium implanted in UO2 sintered pellets by using the 3He(d,α)1H nuclear reaction analysis technique

“…There is indeed a large uncertainty in the value at the maximum of the cross-section. It differs by as much as 30% depending on the authors [13][14][15][16][17][18][19]. The results obtained by the coincidence technique show that the profile at depth over 1 lm can be resolved at a scale of 0.1 lm with a 3 He detection limit close to 0.01 at.% in 3 He implanted UO 2 .…”

Nuclear reaction analysis with ion microbeam of cross sections of surface layers deposited in a tokamak divertor

“…(1), using the cross section fit from Ref. [12]. The integral of the cross section over the relevant energy range differs only by a few percent compared to the more recent measurement [13] and results in a deuterium to carbon ratio of c D =c C ¼ 0:051Á Y M D =Y M C , with Y M D being the yield in the deuterium peak of Fig.…”