Depth-resolved Laue microdiffraction with coded apertures

Abstract

A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.

Upgraded LauePt4 for rapid recognition and fitting of Laue patterns from crystals with unknown orientations

“…The program can handle any ordinary images in TIFF (8-bit), JPEG and BITMAP formats. This feature dramatically reduces the complexity of Laue pattern simulation and fitting compared with the large-scale synchrotron Laue microdiffraction programs (Barabash et al, 2001;Liu et al, 2004;Gupta & Agnew, 2009;Ulrich et al, 2011;Robach & Micha, 2015;Zhang et al, 2017;O ¨rs et al, 2018;Morawiec, 2020;Purushottam Raj Purohit et al, 2022;Gu ¨rsoy et al, 2022;Seret et al, 2022;). LauePt has another unique advantage, namely accurate intensity calculations (based on the kinematic diffraction model).…”