Design and application of novel stripline for IC‐EMC characteristic measurement

Abstract

The International Electrotechnical Commission (IEC) has introduced the IEC 61967‐8 stripline measurement method for the measurement of radiated emissions in integrated circuits (ICs). This method stipulates that the stripline's voltage standing wave ratio (VSWR) must be less than 1.25 within the frequency range of 150 kHz to 3 GHz. The established IEC 61967‐8 stripline measurement method can accurately identify the location of EMI in an IC and hence mitigation measure can be effectively implemented. In this work, the IC stripline design is adapted for ICs with various functions and applications with the aid of Ansys HFSS 3D full‐wave simulations and actual measurements to study the impedance and reflection characteristics of IC striplines on test boards. A novel IC stripline structure design process is proposed to enhance the VSWR performance of IC striplines. Subsequently, a novel IC stripline has been fabricated and tested using the IEC 61967‐8 stripline measurement method. The designed novel IC stripline demonstrated compliance with IEC 61987‐8 specification and the measurement results showed consistency with the simulation results. The works can benefit the promotion of high frequency circuit design and the development of testing process and in turn, enabled the improvement of the reliability and performance of the designed products.