Design and construction of a heat stage for investigations of samples by atomic force microscopy above ambient temperatures

Baekmark, Thomas Rosleff; Bjørnholm, Thomas; Mouritsen, Ole G.

doi:10.1063/1.1147849

Cited by 10 publications

(3 citation statements)

References 28 publications

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“…The first generation of in situ hot stages produced rather limited temperature ranges (T < 100 °C). [108][109][110] 3.1.5 Heating polymers and organics. Polymeric materials benefitted enormously from the initial use of hot stage AFM, as previous in situ queries at high temperatures were mainly restricted to wavelength-limited optical microscopy methods.…”

Section: High-temperature Scanning Probe Microscopymentioning

confidence: 99%

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

Nonnenmann

2016

Nanoscale

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Accurate high temperature characterization of materials remains a critical challenge to the continued advancement of various important energy, nuclear, electronic, and aerospace applications. Future experimental studies must assist these communities to progress past empiricism and derive deliberate, predictable designs of material classes functioning within active, extreme environments. Successful realization of systems ranging from fuel cells and batteries to electromechanical nanogenerators and turbines requires a dynamic understanding of the excitation, surface-mediated, and charge transfer phenomena which occur at heterophase interfaces (i.e. vapor-solid, liquid-solid, solid-solid) and impact overall performance. Advancing these frontiers therefore necessitates in situ (operando) characterization methods capable of resolving, both spatially and functionally, the coherence between these complex, collective excitations, and their respective response dynamics, through studies within the operating regime. This review highlights recent developments in scanning probe microscopy in performing in situ imaging at high elevated temperatures. The influence of and evolution from vacuum-based electron and tunneling microscopy are briefly summarized and discussed. The scope includes the use of high temperature imaging to directly observe critical phase transition, electronic, and electrochemical behavior under dynamic temperature settings, thus providing key physical parameters. Finally, both challenges and directions in combined instrumentation are proposed and discussed towards the end.

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Section: High-temperature Scanning Probe Microscopymentioning

confidence: 99%

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

Nonnenmann

2016

Nanoscale

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“…[6][7][8] The temperature range was very much limited by this method because the AFM system was designed to operate below 40°C. 9 Another possibility was to construct suitable heating stages. [9][10][11] Recently, Higgins et al constructed an AFM working in aqueous solution whose sample stage could be operated up to 150°C.…”

Section: Introductionmentioning

confidence: 99%

“…9 Another possibility was to construct suitable heating stages. [9][10][11] Recently, Higgins et al constructed an AFM working in aqueous solution whose sample stage could be operated up to 150°C. 12 To the best of our knowledge, this is the highest temperature even obtained in an ambient AFM.…”

Section: Introductionmentioning

confidence: 99%

Construction and characterization of a heating stage for a scanning probe microscope up to 215 °C

Xie

Luo

et al. 2000

Review of Scientific Instruments

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In this article, we present a study on construction and characterization of a heating stage compatible to commercially available scanning probe microscopes working in contact and tapping modes. Thermal properties of the heating stage have been characterized. With the heating stage, sample surface temperature can reach as high as 215 °C while the scanner temperature is kept below 125 °C. Below 50 °C, the stage temperature is very stable, with fluctuations less than 0.05 °C within half an hour. In both the contact and tapping mode of the force microscope, the image distortions have been calibrated, which occurs due to the decrease of piezoelectric coefficient at high temperature. It has been found that a cork wood spacer is excellent for thermal isolation to prevent the scanner from overheating. Examples of applications of the heating stage will be presented and discussed.

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Chemical Microscopy

Cooke

1998

Anal. Chem.

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Design and construction of a heat stage for investigations of samples by atomic force microscopy above ambient temperatures

Cited by 10 publications

References 28 publications

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

Construction and characterization of a heating stage for a scanning probe microscope up to 215 °C

Chemical Microscopy

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