Design and Development of a D-Band Corrugated Horn Antenna for Millimeter-Wave Plasma Diagnostics

Abstract

In fusion reaction, plasma parameters such as the density and temperature of electrons should be diagnosed continuously. There are various methods to diagnose plasma parameters. In these, reflectometry systems are widely used to measure the electron density and plasma physics study. In reflectometry systems, antenna plays an important role as a transmitter/receiver element. This paper presents the design of a D-band (110-170 GHz) corrugated horn antenna suitable for reflectometry system. The simulated results for antenna are compared with that of the measurements. Further, different structures are proposed to ease fabrication complexities and reduce cost.

Development of a 70–110 GHz silicon corrugated horn for cosmic microwave background experiment

“…And then Si wafers are stacked into a horn array. The corrugated horn assembled with Si wafers has similar performance with the horn fabricated by machining 13–15 . The use of silicon largely decreases the weight of horns, which lowers the required cooling power on the focal plane.…”

“…The corrugated horn assembled with Si wafers has similar performance with the horn fabricated by machining. [13][14][15] The use of silicon largely decreases the weight of horns, which lowers the required cooling power on the focal plane. Also, the same material to make the horn and detector array module is beneficial to reduce the integration complexity caused by the difference in thermal expansion coefficients of metal and silicon.…”

Profiled Horn Antenna with Wideband Capability Targeting Sub-THz Applications

“…The reflectometry system has stringent antenna specifications in terms of high directivity, suppressed sidelobes, and Gaussian-like radiation characteristics. More details on antennas for the plasma diagnostics system can be found in [17]. Based on the performance comparison of various D-band profiles, two of the horn profiles are scaleddown to the V-band frequencies for testing reasons.…”