2016
DOI: 10.15866/ireaco.v9i1.7831
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Design and Implementation of a Low Cost Automatic Variable Load and Data Acquisition for Characterization of Photovoltaic Modules Simultaneously

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Cited by 4 publications
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“…Local shading, impaired cells, module mismatch, short circuit bypass diodes, reduced shunt resistance, and increased series resistance are signs of impairments seen in the characteristic I-V curve's shape [52]- [54]. Several I − V curve testing methods, including the variable resistive load method [55]- [57], DC-DC loading methods [58], [59], varying electronic load methods (e-load) [56], [60]- [66], and capacitor charging dependent load methods [52], [67]- [73], have been proposed in recent years.…”
Section: Introductionmentioning
confidence: 99%
“…Local shading, impaired cells, module mismatch, short circuit bypass diodes, reduced shunt resistance, and increased series resistance are signs of impairments seen in the characteristic I-V curve's shape [52]- [54]. Several I − V curve testing methods, including the variable resistive load method [55]- [57], DC-DC loading methods [58], [59], varying electronic load methods (e-load) [56], [60]- [66], and capacitor charging dependent load methods [52], [67]- [73], have been proposed in recent years.…”
Section: Introductionmentioning
confidence: 99%