Design and implementation of the multilevel test philosophy

Hardenburg, G.; Duong, Tien Q.

doi:10.1109/autest.1993.396370

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“…To realize vertical testability design and coherence of all test levels, TPS structure can be divided into three layers, which are functional level, fault duplication/detection level and fault isolation level. It is discussed in reference [11] and showed by Fig.4 purpose of fault isolation level is to identify the fault components on the SRU or the least replaceable units.…”

Section: Standard Of Tpsmentioning

confidence: 99%

Study of testability design for complex electronic products

Huang

Lian

Mian³

et al. 2006

2006 7th International Conference on Computer-Aided Industrial Design and Conceptual Design

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It mainly studies the testability design and analysis technology for complex electronic system for meeting the needs of design and product work and service work during using. It lucubrates testability design requests for the segments such as the partition for maintain level, the interface of test data, the interface of UUT and test equipments, during the processes of development, manufacturing and using, etc. The study is important to improve the testability level and realize integral test for electronic products.

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Section: Standard Of Tpsmentioning

confidence: 99%