2010
DOI: 10.3788/lop47.101403
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Design and Precision Analysis of Offline Crystal Frequency Tripling Alignment Adjusting System for SG-Ⅱ

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“…In 2010, Kong et al from the Shanghai Institute of Laser and Plasma Research, Chinese Academy of Engineering Physics (CAEP) used a nanosecond pulsed laser with a beam aperture of about 5 mm and a power density of 1-2 GW/cm 2 to scan the crystal. This measures the optimal phase-matching angle at each point of the crystal and takes the average as a way of reducing the effects of the crystal’s refractive index non-uniformity and the inconsistency of processed shapes [ 17 ]. The Crystal Phase-matching angle Metrology Instrument (CPMI), designed by Pei et al from the Laser Fusion Research Center of the Chinese Academy of Engineering Physics (CAEP) in 2018, used an Nd: YLF laser as the light source and reflected the first-instrumented laser light into the crystal for phase-matching angle measurements through a mirror fixed to a combined X - Z displacement stage, and controlled the stage to change the scanning position as a means of measuring the phase-matching distributions of the crystal at various points [ 18 , 19 ].…”
Section: Introductionmentioning
confidence: 99%
“…In 2010, Kong et al from the Shanghai Institute of Laser and Plasma Research, Chinese Academy of Engineering Physics (CAEP) used a nanosecond pulsed laser with a beam aperture of about 5 mm and a power density of 1-2 GW/cm 2 to scan the crystal. This measures the optimal phase-matching angle at each point of the crystal and takes the average as a way of reducing the effects of the crystal’s refractive index non-uniformity and the inconsistency of processed shapes [ 17 ]. The Crystal Phase-matching angle Metrology Instrument (CPMI), designed by Pei et al from the Laser Fusion Research Center of the Chinese Academy of Engineering Physics (CAEP) in 2018, used an Nd: YLF laser as the light source and reflected the first-instrumented laser light into the crystal for phase-matching angle measurements through a mirror fixed to a combined X - Z displacement stage, and controlled the stage to change the scanning position as a means of measuring the phase-matching distributions of the crystal at various points [ 18 , 19 ].…”
Section: Introductionmentioning
confidence: 99%