Design and Reliability Evaluation of Switching Element for Improving the QoS of Multistage Interconnection Network

Abstract

Reliable and cost effective multistage interconnection networks (MINs) are the backbone of efficient distributed computing in supercomputer systems. In this paper new 3×3, 4×2, and 4×4 switching element (SE) structures are introduced which can be employed in various existing MINs to provide enhanced reliability at much reduced cost. The reliability function of proposed as well as the existing SEs have been formulated on basis of which their reliability values have been computed. The computed reliability values of all SEs (existing and proposed ones) have been compared and analyzed. The achieved results clearly depicts that the proposed SEs possess higher reliability and can replace the existing SEs of similar size without changing the existing design of MIN to improve reliability.

Fault Tolerant Gamma-Minus Network

“…16,[20][21][22][23][24][36][37][38][39]42 To meet such a challenging requirement of these super systems MIN are designed to behave as highly reliable and fault-tolerant interconnection networks. [25][26][27][28][33][34][35][36][37][44][45][46][47][48][49][50] Lot of researchers have paid attention in recent future to develop new designs of MIN which can withstand with multiple fault occurring in the network to provide reliable and pose free communication between processors and memories. [23][24][25][26][27][28][29]32,35,37 All designs of MINs proposed in last five years were centered around providing high fault tolerance by providing more redundant or alternative paths from each source to destination so as to bear more number of faults and providing dynamic rerouting scheme to reroute the packet to the destination through either backtracking or by activating alternative SE 1,[8][9][10][11][12][13]…”