2021
DOI: 10.1016/j.mejo.2021.105125
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Design and simulation of triple metal double-gate germanium on insulator vertical tunnel field effect transistor

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Cited by 22 publications
(2 citation statements)
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“…Although a lot of analytical modeling works considered the T b -dependent current of DG-TFETs, only the study by Lu et al [24] realized this TBE at T b = 2.5 nm. On the contrary, many simulation works showed that the on-current was decreased as T b was scaled below about 10-15 nm [17,18]. Based on the early studies in [15,16], this current degradation was immediately attributed to the volume effect without proper investigations.…”
Section: Volume Effectmentioning
confidence: 99%
See 1 more Smart Citation
“…Although a lot of analytical modeling works considered the T b -dependent current of DG-TFETs, only the study by Lu et al [24] realized this TBE at T b = 2.5 nm. On the contrary, many simulation works showed that the on-current was decreased as T b was scaled below about 10-15 nm [17,18]. Based on the early studies in [15,16], this current degradation was immediately attributed to the volume effect without proper investigations.…”
Section: Volume Effectmentioning
confidence: 99%
“…In those investigations, however, the BTBT current was overestimated by about three orders of magnitude, making their conclusions on the volume effect unreliable. In addition, while many simulation works observed the volume effect at T b below about 10-15 nm [15][16][17][18], analytical models could not [19,20]. Therefore, properly re-evaluating this TBE is important to understand not only its role in determining the on-current but also what should be improved in analytical models to study TBEs.…”
Section: Introductionmentioning
confidence: 99%