2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2019
DOI: 10.1109/icecs46596.2019.8965003
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Design and testing of a CMOS Self-Biased Current Source

Evandro Bolzan
1
,
Elias Buhler Storck
2
,
M.C. Schneider
3
et al.
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