2016
DOI: 10.1016/j.ijleo.2015.10.118
|View full text |Cite
|
Sign up to set email alerts
|

Design calculations and characterization of C/Cr multilayer mirrors in the 6 nm BEUV

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 4 publications
0
1
0
Order By: Relevance
“…during the deposition were shown to improve the interfaces, thermal stability and stress in Cr-based multilayers. Accurate structural characterizations were carried out to gain further knowledge about the interface characteristics in Cr/C or Cr/B 4 C multilayers by grazing-incidence X-ray reflectometry (Alnaimi et al, 2016;Burcklen et al, 2016), transmission electron microscopy (TEM) (Jiang et al, 2011;Burcklen et al, 2016) and Raman spectrometry (Tu et al, 2014), etc. Cr/Sc multilayers were also investigated by TEM and X-ray scattering to study their thermal stability (Majkova et al, 2006).…”
Section: Introductionmentioning
confidence: 99%
“…during the deposition were shown to improve the interfaces, thermal stability and stress in Cr-based multilayers. Accurate structural characterizations were carried out to gain further knowledge about the interface characteristics in Cr/C or Cr/B 4 C multilayers by grazing-incidence X-ray reflectometry (Alnaimi et al, 2016;Burcklen et al, 2016), transmission electron microscopy (TEM) (Jiang et al, 2011;Burcklen et al, 2016) and Raman spectrometry (Tu et al, 2014), etc. Cr/Sc multilayers were also investigated by TEM and X-ray scattering to study their thermal stability (Majkova et al, 2006).…”
Section: Introductionmentioning
confidence: 99%