Wiley Encyclopedia of Electrical and Electronics Engineering 1999
DOI: 10.1002/047134608x.w6406
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Design for Microelectronics Reliability

Abstract: The sections in this article are Reliability Concepts Types of Failure Distributions Failure Mechanism Acceleration Defects and Burn‐In Thermomechanical Models Electrochemical Models Forced‐Diffusion Transport Models Oxidation … Show more

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