Design for Testability of Software-Based Self-Test for Processors

Nakazato,; Ohtake,; Inoue,; Fujiwara,

doi:10.1109/ats.2006.260958

Cited by 19 publications

(2 citation statements)

References 4 publications

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“…Functional test sequences can also be generated on chip by using a built-in test generation method [Chen and Dey 2001;Parvathala et al 2002;Kranitis et al 2005;Nakazato et al 2006]. However, sequential test generation provides a higher gate-level fault coverage by targeting gate-level faults directly.…”

Section: Introductionmentioning

confidence: 99%

A Generalized Definition of Unnecessary Test Vectors in Functional Test Sequences

Pomeranz

2015

ACM Trans. Des. Autom. Electron. Syst.

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A class of static test compaction procedures for functional test sequences is based on the omission of unnecessary test vectors. According to the definition used by these procedures, a test vector is unnecessary if all the target faults continue to be detected after it is omitted. This article introduces a more general definition of unnecessary test vectors that allows additional ones to be omitted. According to this definition, a test vector is unnecessary if every target fault can be detected by a sequence that is obtained after omitting the vector, and possibly other vectors. The article develops a procedure for omitting test vectors based on this definition and discusses its effects on the storage requirements and test application time. ACM Reference Format:Irith Pomeranz. 2015. A generalized definition of unnecessary test vectors in functional test sequences. ACM Trans.

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Section: Introductionmentioning

confidence: 99%

A Generalized Definition of Unnecessary Test Vectors in Functional Test Sequences

Pomeranz

2015

ACM Trans. Des. Autom. Electron. Syst.

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“…In addition, they avoid overtesting of delay faults that may occur with scan-based tests [2][3][4]. To avoid the need for a tester that can apply functional test sequences, the sequences can be applied from an onchip memory as in the case of software-based self-test approaches [5][6][7][8]. Recent interest in functional test sequences can be seen from [9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Reconstruction of a functional test sequence for increased fault coverage

Pomeranz

2017

IET Computers & Digital Techniques

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Simulation-based sequential test generation procedures address the high computational complexity of sequential test generation by replacing the deterministic branch-and-bound process with lower-complexity processes. These processes introduce new primary input patterns into a functional test sequence in order to increase its fault coverage. This study observes that, even without introducing new primary input patterns, it is possible to increase the fault coverage of a functional test sequence by applying the same primary input patterns in different orders. This is referred to as reconstruction of the sequence. It provides a new low-complexity option for increasing the fault coverage, and thus addressing the high computational complexity of sequential test generation. This study describes a reconstruction procedure that is based on repeating short subsequences of primary input patterns from the sequence. Experimental results demonstrate the effectiveness of the reconstruction procedure in increasing the fault coverage as part of a simulation-based sequential test generation procedure.

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On-line self-test mechanism for Dual-Core Lockstep System-on-Chips

Floridia

Sánchez

2020

Microelectronics Reliability

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Design for Testability of Software-Based Self-Test for Processors

Cited by 19 publications

References 4 publications

A Generalized Definition of Unnecessary Test Vectors in Functional Test Sequences

A Generalized Definition of Unnecessary Test Vectors in Functional Test Sequences

Reconstruction of a functional test sequence for increased fault coverage

On-line self-test mechanism for Dual-Core Lockstep System-on-Chips

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