1996
DOI: 10.1063/1.1146998
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Design of a ‘‘beetle-type’’ atomic force microscope using the beam deflection technique

Abstract: In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam deflection method to detect the deflection of the cantilever. All optical components are integrated into the microscope head which has a diameter of 40 mm. This compactness results in a high mechanical stability, while the adjustment of the optical pathway i… Show more

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Cited by 5 publications
(3 citation statements)
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“…The values of Q and k that are used in practice cover a wide range of values. For example, the spring constant of microfabricated cantilevers is usually in the range of kϭ0.01-0.5 N/m, 14,15 and a value of Q in the order of 6 has been determined for a microcantilever used in a commercial AFM. 12 On the other hand, a homefabricated cantilever using a section of an optical fiber which was used in a near-field scanning optical microscope 16 had a spring constant of kϭ80 N/m and a Q factor of 290.…”
Section: Comparison Of the Source-induced Noise With The Thermal-vmentioning
confidence: 99%
“…The values of Q and k that are used in practice cover a wide range of values. For example, the spring constant of microfabricated cantilevers is usually in the range of kϭ0.01-0.5 N/m, 14,15 and a value of Q in the order of 6 has been determined for a microcantilever used in a commercial AFM. 12 On the other hand, a homefabricated cantilever using a section of an optical fiber which was used in a near-field scanning optical microscope 16 had a spring constant of kϭ80 N/m and a Q factor of 290.…”
Section: Comparison Of the Source-induced Noise With The Thermal-vmentioning
confidence: 99%
“…Measurement instruments developed for small samples, when miniaturized, tend to reach a point of enabling them to be positioned on larger samples. This has been the case for the contact angle goniometer, 35 atomic force microscope ("beetle-type") 36 and portable X-ray fluorescence meters. 37 We further believe that for visualization, the microscope can be eliminated and a simple consumer-grade or cell phone camera can be used.…”
Section: Discussionmentioning
confidence: 99%
“…The electronics for amplification and subtraction of the four-quadrant photodiode signal was originally developed for a laser beam deflection atomic force microscope. 8 The electronic circuits were used without modification.…”
Section: Designmentioning
confidence: 99%