A new methodology to study irregular behaviours in logic cells is reported. It is based on two types of diagrams, namely phase and working diagrams. Sets of four bits are grouped and represented by their hexadecimal equivalent. Some hexadecimal numbers correspond to certain logic functions. The influence of the internal and external tolerances, namely those appearing in the employed devices and in the working signals, may be analysed with this method. Its importance in the case of logic structures with chaotic behaviours is studied.