2023
DOI: 10.1109/tcsi.2023.3268625
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Design of a Novel Self-Test-on-Chip Interface ASIC for Capacitive Accelerometers

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Cited by 5 publications
(1 citation statement)
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“…Therefore, they need amplifiers to boost such signals to levels compatible with typical analog-to-digital converter (ADC) input ranges. To achieve a sufficient signal-to-noise ratio, the input-referred error of the amplifier should be reduced to a low enough level, which means the amplifier must have low thermal and 1/f noise, high accuracy, and low drift [10,11]. Achieving all these is quite challenging in today's mainstream CMOS technology, whose inherent precision is limited by 1/f noise, component mismatch, gain error, and drift.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, they need amplifiers to boost such signals to levels compatible with typical analog-to-digital converter (ADC) input ranges. To achieve a sufficient signal-to-noise ratio, the input-referred error of the amplifier should be reduced to a low enough level, which means the amplifier must have low thermal and 1/f noise, high accuracy, and low drift [10,11]. Achieving all these is quite challenging in today's mainstream CMOS technology, whose inherent precision is limited by 1/f noise, component mismatch, gain error, and drift.…”
Section: Introductionmentioning
confidence: 99%