Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Abstract

In this paper, an oscillation-based built-in self-test system for active an analog integrated circuit is presented. This built-in self-test system was used to detect catastrophic and parametric faults, introduced during chip manufacturing. As circuits under test (CUT), second-order Sallen-Key, Akerberg-Mossberg and Tow-Thomas biquad filters were designed. The proposed test hardware detects parametric and catastrophic faults on changeable limits. The influence of both oscillation and test hardware on fault detection limits were investigated and analyzed. The proposed oscillation based self-test system was designed and simulated in 0.18 µm complementary metal-oxide semiconductor (CMOS) technology. Due to the easiness of implementation and configuration for testing of different active analog filters, such self-test systems can be effectively used in modern integrated circuits, made of a large number of devices and circuits, such as the multi-standard transceivers used in the core hardware of software-defined radios. Using the proposed test strategy, the fault tolerance limits for catastrophic faults varied from 96% to 100% for all injected faults in different structures of low pass filters (LPF). The detection range of parametric faults of passive components’ nominal value, depending on the used structure of the filter, did not exceed –0.74% – 0.72% in case of Sallen-Key, –3.31% – 1.00% in case of Akerberg-Mossberg and –2.39% – 1.44% in case of Tow-Thomas LPF.

Parametric Fault Diagnosis of Very High-Frequency Circuits Containing Distributed Parameter Transmission Lines

“…Catastrophic fault diagnosis of bipolar and Complementary Metal Oxide Semiconductor (CMOS) circuits was considered in [18]. Some research studies concentrate on self-testing methods [19]. Numerous works describe artificial intelligence method applications to fault diagnosis [20][21][22].…”

A Method for Diagnosing Soft Short and Open Faults in Distributed Parameter Multiconductor Transmission Lines

“…Many fault diagnostic methods have been collected and discussed in the references [1][2][3][4]. Diverse diagnostic subjects have been studied over the last decades, e.g., testability analysis [5][6][7], arranging diagnostic tests [8,9], self-testing [10,11], and the detection, location, and evaluation of single or multiple faults in linear circuits [12,13] and nonlinear circuits [14][15][16], including the circuits designed in sub-micrometer technology [17][18][19][20]. Some diagnostic algorithms employ various concepts of artificial intelligence [21][22][23][24][25] and statistical analysis [26,27].…”