The high open-circuit voltage (V
OC)
in silicon heterojunction solar cells is attributed to the superior
amorphous–crystalline silicon interface passivation. In this
work, we investigated a method called intermediate hydrogen plasma
treatment (I-HPT) in which the intrinsic amorphous silicon is exposed
to hydrogen plasma in between the deposition using direct current
(d.c.) plasma-enhanced chemical vapor deposition. This method can
not only enhance the surface passivation but also find industrial
application due to its ease of integration in the production line.
Fourier transform infrared spectroscopy reveals that I-HPT makes the
bulk of the amorphous matrix more disordered. We anticipate that the
improvement in passivation comes from the diffusion of hydrogen from
the bulk to the interface and shifting of the film closer to the “amorphous-to-microcrystalline”
transition regime. Our optimized I-HPT method can obtain an implied V
OC of 746 mV without annealing, which corresponds
to a low surface recombination velocity of 3.2 cm/s. Therefore, we
propose the I-HPT method as an alternative to high-temperature annealing
which can reduce a fabrication step and processing time. The I-HPT
films characterized by Raman spectroscopy do not show any hydrogen-induced
crystallization. We have also demonstrated the proof of concept by
applying I-HPT to a silicon heterojunction solar cell which shows
∼15 mV increase in V
OC in the device
and an absolute increase in efficiency by 0.3% as compared to a cell
with no HPT.