2020 IEEE 9th Joint International Information Technology and Artificial Intelligence Conference (ITAIC) 2020
DOI: 10.1109/itaic49862.2020.9338967
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Design of Fault Feature Extraction Algorithm Model for Distribution Network Based on Wavelet Entropy

Rui Li
1
,
Xiaobing Shang
2
,
Pei-xuan Gu
3
et al.
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