Design of low temperature (54 K) reusable test fixture based on pogo pin and Al2O3 HTCC ceramics

Zhang, Rui; Lu, Xilong; Fang, Xueyang; Wei, Guangsong; Zhou, Shigang; Tao, Yunxi; Kong, Qingyu

doi:10.1109/icmmt61774.2024.10672491

2024 International Conference on Microwave and Millimeter Wave Technology (ICMMT) 2024

DOI: 10.1109/icmmt61774.2024.10672491

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Design of low temperature (54 K) reusable test fixture based on pogo pin and Al2O3 HTCC ceramics

Rui Zhang,

Xilong Lu,

Xueyang Fang

et al.

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Design of low temperature (54 K) reusable test fixture based on pogo pin and Al2O3 HTCC ceramics

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References 8 publications

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